Mixed Former Effect on the Photo Physical Properties of Phospho Tellurite Based Glasses

Abstract

Phospho-Tellurite glass was prepared earth to study the network former mixing effect in the prepared glass. The glass was prepared by melt quench technique in an electrical furnace at a temperature of 1100 °C. Glass were made in palettes of 2mm in size. The prepared glass was then characterized by using Raman, FTIR and UV- VIS (Reflectance) Spectroscopy. Raman Spectra revealed that phospho-tellurite are suitable for Raman broadband Amplifiers. FTIR revealed the functional groups of glass and verified the presence of non-bridging oxygen atoms. Whereas UV-VIS (Reflectance) Spectra was used to calculate the band gap of prepared glass sample. When UV-Vis spectrum will be examined via various wavelength it will show the absorbance of one or more sample component. The crystalline phase available in material will be recognized by XRD technique and it also discloses the chemical structure. Absorption data will assist the calculation of band gap. To compute the spectroscopic and electronic properties we also aspire to achieve the computational simulation that will yield further awareness.